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disertacija
Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology

Josip Žilak (2017)
Sveučilište u Zagrebu
Fakultet elektrotehnike i računarstva
Zavod za elektroniku, mikroelektroniku, računalne i inteligentne sustave
Citirajte ovaj rad

Žilak, J. (2017). Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology (Disertacija). Preuzeto s https://urn.nsk.hr/urn:nbn:hr:168:980460

Žilak, Josip. "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology." Disertacija, Sveučilište u Zagrebu, Fakultet elektrotehnike i računarstva, 2017. https://urn.nsk.hr/urn:nbn:hr:168:980460

Žilak, Josip. "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology." Disertacija, Sveučilište u Zagrebu, Fakultet elektrotehnike i računarstva, 2017. https://urn.nsk.hr/urn:nbn:hr:168:980460

Žilak, J. (2017). 'Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology', Disertacija, Sveučilište u Zagrebu, Fakultet elektrotehnike i računarstva, citirano: 14.10.2019., https://urn.nsk.hr/urn:nbn:hr:168:980460

Žilak J. Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology [Disertacija]. Zagreb: Sveučilište u Zagrebu, Fakultet elektrotehnike i računarstva; 2017 [pristupljeno 14.10.2019.] Dostupno na: https://urn.nsk.hr/urn:nbn:hr:168:980460

J. Žilak, "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology", Disertacija, Sveučilište u Zagrebu, Fakultet elektrotehnike i računarstva, Zagreb, 2017. Dostupno na: https://urn.nsk.hr/urn:nbn:hr:168:980460