Downsized high resolution wavelength dispersive x-ray spectrometer was constructed for work with focused beams on ion microprobe. The experience gained in using the present large spectrometer designed for broad beams to measure Kβ spectra of 3d transition metals' and their compounds in the Laboratory for ion beam interactions was taken in account. Important advantage of the new spectrometer is in its simplicity: both target and the detector are mounted on fixed positions while the change of diffraction angle is achieved by linear displacement of the flat diffraction crystal along the axis parallel to the ion beam direction. Downsizing was achieved by combining ion microbeam and CCD detector of good spatial resolution, which together with reasonably good energy resolution enables measurement of the fine structure in x-ray spectra on microscopic samples. All steps of the spectrometer’s development are described and they include geometry optimisation with XTRACE simulations and design of the vacuum chamber which encloses sample holder, crystal and detector. Algorithms for transferring two-dimensional images of the radiation collected with the position sensitive detector to x-ray energy spectra is developed. Spectrometer was used to test influence of chemical effects on characteristic Kα and Kβ x-ray emission of silicon, sulphur and their compounds induced by protons. Multiple ionization and its consequences on characteristic x-ray emission of sulphur were measured with carbon ions. Spectrometer's capabilities to distinguish sulphate and sulphide compounds based on chemical effects in sulphur Kβ spectra induced with protons are demonstrated. Also possibilities to resolve K and M lines that overlap in energy dispersive spectra are shown.