prikaz prve stranice dokumenta Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology
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doctoral thesis
Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology
Zagreb: University of Zagreb, Faculty of Electrical Engineering and Computing, 2017. urn:nbn:hr:168:980460

University of Zagreb
Faculty of Electrical Engineering and Computing
Department of Electronics, Microelectronics, Computer and Intelligent Systems

Cite this document

Žilak, J. (2017). Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology (Doctoral thesis). Zagreb: University of Zagreb, Faculty of Electrical Engineering and Computing. Retrieved from https://urn.nsk.hr/urn:nbn:hr:168:980460

Žilak, Josip. "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology." Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, 2017. https://urn.nsk.hr/urn:nbn:hr:168:980460

Žilak, Josip. "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology." Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, 2017. https://urn.nsk.hr/urn:nbn:hr:168:980460

Žilak, J. (2017). 'Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology', Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, accessed 17 July 2024, https://urn.nsk.hr/urn:nbn:hr:168:980460

Žilak J. Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology [Doctoral thesis]. Zagreb: University of Zagreb, Faculty of Electrical Engineering and Computing; 2017 [cited 2024 July 17] Available at: https://urn.nsk.hr/urn:nbn:hr:168:980460

J. Žilak, "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology", Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, Zagreb, 2017. Available at: https://urn.nsk.hr/urn:nbn:hr:168:980460

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